{"id":10888,"date":"2016-10-21T12:03:00","date_gmt":"2016-10-21T12:03:00","guid":{"rendered":"https:\/\/v4.pv-tech.org\/technical-papers\/metrology-at-the-ingot-level-addressing-the-growing-importance-of-bulk-material-quality\/"},"modified":"2023-07-28T16:46:18","modified_gmt":"2023-07-28T16:46:18","slug":"metrology-at-the-ingot-level-addressing-the-growing-importance-of-bulk-material-quality","status":"publish","type":"technical-papers","link":"https:\/\/www.pv-tech.org\/technical-papers\/metrology-at-the-ingot-level-addressing-the-growing-importance-of-bulk-material-quality\/","title":{"rendered":"Metrology at the ingot level: Addressing the growing importance of bulk material quality"},"content":{"rendered":"<p>By Bernhard Mitchell, Daniel Chung, J\u00fcrgen Weber &#038; Thorsten Trupke University of New South Wales (UNSW), Sydney; BT Imaging Pty Ltd, Sydney, Australia<\/p>\n<p>With the PV industry continually pushing for ever&#45;higher silicon solar cell efficiencies, the requirements on the electronic quality of the bulk material are becoming more stringent. Advanced characterization of silicon<br \/>\ningots after cutting into bricks allows early quality control and immediate feedback in crystal growth, thereby facilitating shorter R&#038;D cycles, higher yield, lower cost and higher product quality in mass manufacturing.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>With the PV industry continually pushing for ever&#45;higher silicon solar cell efficiencies, the requirements on the electronic quality of the bulk material are becoming more stringent. Advanced characterization of silicon<br \/>\ningots after cutting into bricks allows early quality control and immediate feedback in crystal growth, thereby facilitating shorter R&#038;D cycles, higher yield, lower cost and higher product quality in mass manufacturing.<\/p>\n","protected":false},"author":1,"featured_media":28291,"template":"","paywall-tags":[8671],"technical-papers-categories":[2931,2921],"class_list":["post-10888","technical-papers","type-technical-papers","status-publish","has-post-thumbnail","hentry","paywall-tags-premium","technical-papers-categories-materials","technical-papers-categories-photovoltaics-international-papers"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v26.4 (Yoast SEO v26.4) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Metrology at the ingot level: Addressing the growing importance of bulk material quality - PV Tech<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.pv-tech.org\/technical-papers\/metrology-at-the-ingot-level-addressing-the-growing-importance-of-bulk-material-quality\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Metrology at the ingot level: Addressing the growing importance of bulk material quality\" \/>\n<meta property=\"og:description\" content=\"With the PV industry continually pushing for ever&#045;higher silicon solar cell efficiencies, the requirements on the electronic quality of the bulk material are becoming more stringent. 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